Senior Photonic Test & Automation Engineer

Senior Photonic Test & Automation Engineer

Full-Time 99720 - 121880 $ / year (est.) On-site
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At a Glance

  • Tasks: Advance wafer-level measurements and build automated test systems for photonic ICs.
  • Company: Join HyperLight, a fast-growing team in the photonics industry.
  • Benefits: Competitive salary, flexible work options, and opportunities for professional growth.
  • Other info: Be part of a dynamic team shaping the future of TFLN photonics.
  • Why this job: Make an impact in cutting-edge photonics technology and collaborate with top experts.
  • Qualifications: Hands-on photonic testing expertise and strong Python automation skills required.

The predicted salary is between 99720 - 121880 $ per year.

Hyper Light is seeking a Senior / Staff Photonic Test Development Engineer to advance wafer-level measurements on photonic ICs and build scalable, automated test systems.

You will collaborate with external test partners and internal teams to deliver precise characterisation and feedback on chip performance.

The role requires hands-on photonic testing expertise, strong Python automation, and a track record with photonic test equipment.

Join a fast-growing team shaping TFLN photonics deployment.

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Senior Photonic Test & Automation Engineer employer: HyperLight

HyperLight is an exceptional employer, offering a dynamic work environment in the heart of Cambridge, MA, where innovation meets collaboration. Our commitment to employee growth is evident through continuous learning opportunities and a culture that values safety and rigorous experimental design. Join us to be part of a team that not only drives technological advancements but also fosters a supportive atmosphere for personal and professional development.

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Contact Details:

HyperLight Recruitment Team

We think you need these skills to ace Senior Photonic Test & Automation Engineer

Photonic Testing Expertise
Wafer-Level Measurements
Automated Test Systems
Collaboration Skills
Python Automation
Photonic Test Equipment Proficiency
Chip Performance Characterisation